The images in this page show the fracture microstructural features of a sintered material. The investigation was performed by means of a PHILIPS ESEM XL 30 TMP W Scanning Electron Microscope, using the backscattered electron signal. The material is mainly composed by Nickel, Chromium and Cobalt. Nickel concentrates in spheroids also. The first image shows one of such spheroids. The second image is a detail of the spheroid surface. The chemical analysis of the various features can be performed by the X-ray energy dispersive spectrometer (EDS) available as a part of the ESEM equipment.


Backscattered electron image coloured by computer aids

Backscattered electron image coloured by computer aids.


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Last updated: March.06.2004

Images are ESEMIR ownership. For any use, ask for permission.